Radiation Test

Bloom Filter-Based Soft Error Detection in Instruction memory: Insights from Neutron Beam and FI campaigns
As memory cells continue to shrink in modern semiconductor technologies, radiation-induced Single Event Effects, such as single- and …
Elijah Cishugi, Tijmen T. Smit, Bruno Endres Forlin, Cazzaniga Carlo, Kuan-Hsun Chen, Marco Ottavi
DOI