DFTS 2026 Paper Accepted: The Reliability Cost of Partial SIHFT

Happy to share that our paper has been accepted as a poster at IEEE DFTS 2026!

The Reliability Cost of Partial SIHFT: Fault-Injection and Neutron-Beam Evaluation of RTailor

In this work, we evaluate RTailor using both FPGA-based fault injection and neutron-beam radiation testing. The results show that full software-implemented hardware fault tolerance significantly improves reliability. More surprisingly, partial protection can perform worse than no protection at all, despite introducing substantial implementation overhead.

This negative result highlights why resilience mechanisms must be validated experimentally under realistic fault conditions rather than assumed to provide proportional reliability benefits.

Congratulations to Tijmen T. Smit, a PhD student of Marco Ottavi, and to our co-authors Shao-Yu Huang, Yida Zhang, Carlo Cazzaniga, Changhee Jung, and Marco Ottavi.

Looking forward to Tijmen presenting our work at IEEE DFTS 2026 in Rome!